HCPL-263N-500E

The HCPL-263N-500E optocoupler logic gate is a high-performance solution with versatile compatibility, boasting HCMOS/LSTTL/TTL performance adaptability. Notable features include an outstanding Common Mode Rejection (CMR) – 1000 V/μs minimum CMR at VCM = 50V for the HCPL-261A family and 15 kV/μs minimum CMR at VCM = 1000V for the HCPL-261N family. The device operates at a high speed of 10 MBd, ensuring efficient data transfer. Its AC and DC performance is specified over an industrial temperature range of –40°C to +85°C, and it is available in 8-pin DIP and SOIC-8 packages for flexible integration. Safety certifications, including UL recognition, CSA approval, and compliance with IEC/EN/DIN EN 60747-5-5 standards, make the HCPL-263N-500E a reliable and secure component for various digital logic applications.

• Low input current (3.0 mA) HCMOS compatible version of 6N137 optocoupler • Isolated line receiver

• Simplex/multiplex data transmission

• Computer-peripheral interface

• Digital isolation for A/D, D/A conversion

• Switching power supplies

• Instrumentation input/output isolation

• Ground loop elimination

• Pulse transformer replacement

The HCPL-261A family of optically coupled gates shown on this data sheet provide all the benefits of the industry standard 6N137 family with the added benefit of HCMOS compatible input current. This allows direct interface to all common circuit topologies without additional LED buffer or drive components. The AlGaAs LED used allows lower drive currents and reduces degradation by using the latest LED technology. On the single channel parts, an enable output allows the detector to be strobed. The output of the detector IC is an open collector schottky-clamped transistor. The internal shield provides a minimum common mode transient immunity of 1000V/µs for the HCPL-261A family and 15000 V/µs for the HCPL-261N family.

It is advised that normal static precautions be taken in handling and assembly of this component to prevent damage and/or degradation which may be induced by ESD.

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